Conforms To
IEC60884 Figure 27& Figure 42
Low Temperature Ram Impact Test Apparatus (Model:SFT S2-1308)
Application
TheApparatus for impact test at low temperature is subjected to an impact test bymeans of an apparatus as shown in IEC60884 figure 27 and figure 42.
At the endof this period, each specimen, in turn, is placed in the normal position of useas shown in figure 27 and figure 42, and a weight is allowed to fall from aheight of 100 mm.
Conforms To
IEC60884 Figure 27& Figure 42
Specifications
A, impactheight: 10~250mm.
B, Mass ofthe falling weight : (1000 ± 2) g and (100 ± 1)g
C, Dimensions : W*D*H=300*110*515mm
D, Weight : 16KG
OrderingInformation
SFT S2-1308Low Temperature Ram Impact Test Apparatus
Include 1unit weight (1000 ± 2) g,
1 unit weight (100 ± 1) g,
Options:Other weights according to different test require
