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Jointed test finger 1 (test probe B of IEC61032) (Model:SFT S1-2010)

Conforms to

IEC60065, IEC  60335-1, IEC 60529, IEC60884-1, IEC60950, IEC60745-1,IEC61032 test probe B




Jointed test finger 1 (test probe B of IEC61032) (Model:SFT S1-2010)


Application

Safequipmentoffers a wide range of probes to meet the most common standards including thosefrom IEC, EN, UL, GB, and others. Such standards require the checking ofaccessibility to dangerous parts of home electronics and appliances, toys,tools, and a host of other products that are intended to be protected byenclosures. These probes simulate human fingers, tools, and other items thatwould be hazardous to come in contact with certain parts of products.

These probes are constructed from Delrin and appropriate steel or stainlesssteel etc. . Each probe is supplied with a certificate of calibration.

Specifications

Parts

Specifications

Conforms to

Remark

SFT S1-2010

Jointed  test finger  1


Insulated part20*Ø50, 100mm long



IEC60065, IEC  60335-1, IEC 60529, IEC60884-1, IEC60950, IEC60745-1


IEC61032 test probe B


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